Dynamic N-Detect Patterns Based on Equivalent Faults
نویسندگان
چکیده
This paper investigates a method of using equivalent fault metrics to optimize N-detect scan ATPG patterns. The introduction goes over the motivation for using N-detect scan patterns and why dynamic N-detect patterns are useful. The next section discusses what equivalent fault metrics are and why equivalent fault metrics might apply to dynamic Ndetect scan patterns selection. We then present experimental results covering the pattern count and test effectiveness of the dynamic N-detect algorithm.
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